OLED Testing station is shown above. The test station includes a semiconductor parameter analyzer, a spectrophotometer with fiber optic collector, a probe station, and a large are detector.
The electronic properties of OLEDs and other thin film devices can be measured at extremely low temperatures using a cryostat.
The automated testing station shown above can monitor the performance of OLEDs over several weeks. Such measurements help to identify factors that contribute to the aging of OLEDs