Optoelectronic Components and Materials Group

Prof. Stephen Forrest

OLED testing

OLED Testing station is shown above. The test station includes a semiconductor parameter analyzer, a spectrophotometer with fiber optic collector, a probe station, and a large are detector.

The automated lifetime testing station shown in the two pictures above can monitor the performance and degradation of OLEDs over long periods. This custom built system can test up to 50 devices simultaneously and is backed up against power failure for long term tests.

The electronic properties of OLEDs and other thin film devices can be measured at extremely low temperatures using a cryostat.