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X-ray
(above)Rigaku X-ray diffractometer is used to study the crystalline structure of organic thin films.
Facilities
Analysis & Spectroscopy
Lasers
Spectrometers
Surface Science
X-ray crystallography
Device Testing
OLED Testing
PV and Photodetector testing
Microscopy & Metrology
AFM
Film Thickness
Optical Microscopy
Thin Film Growth
Crystalline Organic Films
Molecular Beam Epitaxy
OLED Fabrication
Organic Film Patterning
Organic PV and Photodetector