X-ray

(above)Rigaku X-ray diffractometer is used to study the crystalline structure of organic thin films.

Facilities

• Analysis & Spectroscopy

  • Lasers
  • Spectrometers
  • Surface Science
  • X-ray crystallography

• Device Testing

  • OLED Testing
  • PV and Photodetector testing

• Microscopy & Metrology

  • AFM & SEM
  • Film Thickness
  • Optical Microscopy

• Thin Film Growth

  • Crystalline Organic Films
  • Molecular Beam Epitaxy
  • OLED Fabrication
  • Organic Film Patterning
  • Organic PV and Photodetector